Durability Guarantee in Software Transactional Memory

Keonwoo Lee, Youjip Won

Abstract


Non-volatile memories are next generation storage devices which maintain data on memory cell regardless of system power. However, non-volatile memories are hard to guarantee transaction’s ACID properties when abnormal system crash occurs. In this paper, we implement fail-safe software transactional memory(F-STM). F-STM guarantee durability by locating F-STM’s data structure to non-volatile memory. Using F-STM, computer structure based on non-volatile memory can provide data integrity. 


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